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Page: 338
 
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  • Title
  • Anti Plagiarism certificate
  • Dedication
  • Declaration
  • Certificate (Guide)
  • Abstract
  • Acknowledgement
  • Contents
  • List of Tables
  • List of Figures
  • Abbreviations
  • 1. Introduction
  • 2. Overview of leakage current and NBTI effects
  • 3.Leakage power reduction techniques and NBTI benefits
  • 4. Delay efficient FS-S technique for leakage reduction
  • 5. FS-S to generic logic circuits under iso-area condition
  • 6. Application of FS-S to SRAM cell
  • 7. NBTI aging benefits of FS-S
  • Conclusion
  • Appendix
  • List of publications