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  • TITLE
  • DEDICATION
  • CERTIFICATE
  • DECLARATION
  • ACKNOWLEDGEMENT
  • CONTENTS
  • PREFACE
  • List of Publications
  • 1. BRIEF REVIEW OF THE ELECTRICAL, OPTICAL AND STRUCTURAL STUDIES IN PHTHALOCYANINES
  • 1.1 Introduction
  • 1.2 Organic Semiconductors
  • Table 1.2.1 A comparison of the electrical conduction parameters for the organic and inorganic semiconductors
  • 1.3 Molecular Structure
  • Fig.1.3.1 Basic structural unit of a phthalocyanine molecule
  • Fig.1.3.2 Unit cell of a base centred phthalocyanine molecule
  • Fig.1.3.3 Normal projection of two molecules of the metal substituted phthalocyanine
  • 1.4 Earlier Studies on Phthalocyanines
  • A. Electrical studies
  • B. Optical studies
  • C. Structural studies
  • References
  • 2. APPARATUS AND EXPERIMENTAL TECHNIQUES USED IN THE PRESENT STUDY
  • 2.1 Introduction
  • 2.2 Methods of Preparation of Thin Films
  • 2.3 Thermal Evaporation Technique
  • 2.4 Effect of Residual Gases
  • Table 2.4.1 Data on the residual air at 25°C in a typlcal vacuum used for film deposition
  • 2.5 Effect of Vapour Beam intensity
  • 2.6 Effect of Substrate Surface
  • 2.7 Effect of Evaporation Rate
  • 2.8 Contamination from Vapour Source
  • 2.9 Purity of the Evaporating materials
  • 2.10 Production of Vacuum
  • 2.11 Oil Sealed Rotary Pump
  • Fig. 2.11.1 Schematic diagram of the cross section of an oil sealed rotary pump
  • 2.12 Diffusion Pump
  • Fig.2.12.1 Schematic diagram of the cross section of a diffusion pump
  • 2.13 Vacuum Coating Unit
  • Fig.2.13.1 Schematic diagram of a vacuum coating unit
  • Fig.2.13.2 Schematic representation of Pirani gauge
  • Fig.2.13.3 Schematic representation of Penning gauge
  • Fig.2.13.4 Photograph of the coating unit along with the accessories
  • 2.14 Preparation of Films
  • 2.15 Substrate Cleaning
  • 2.16 Substrate Heater
  • 2.17 Sample Annealing
  • Fig.2.17.1 Block diagram of the temperature comtroller cum recorder
  • Fig.2.17.2 Photograph of the annealing furnace and controller cum recorder set up
  • 2.18 Thickness Measurement
  • 2.19 Tolanskys Multiple Beam Interference Technique
  • Fig.2.19.1 Schematic representation of the multiple beam interference technique
  • 2.20 Conductivity Cell
  • Fig.2.20.1 Schematic diagram of the cross section of the conductivity cell
  • 2.21 Keithley Programmable Electrometer
  • Fig.2.21.la Schematic diagram of measuring resistance on Keithley using ohms function
  • Fig.2.21.lb Schematic diagram of measuring resistance on Keithley using V/1 function
  • Fig.2.21.2 Schematic diagram of eledrical conductivity measurement
  • Fig.2.2 1.3 Photograph of the electrical conductivity experimental set up
  • 2.22 UV-Visible Spectrophotometer
  • Fig.2.22.1 Block diagram of the optical system of the spectrophotometer
  • Fig.2.22.2 Block diagram of the electrical system of the spectrophotometer (Shimadzu 160A)
  • Fig.2.22.3 Photograph of the Shimadzu 160A spectrophotometer
  • 2.23 X-ray Diffractometer
  • Fig.2.23.1 Block diagram of XD 610 diffractometer
  • Fig.2.23.2 Photograph of the XD 610 diffractometer
  • References
  • 3. ELECTRICAL STUDIES IN MAGNESIUM PHTHALOCYANINE, IRON PHTHALOCYANINE AND ZINC PHTHALOCYANINE THIN FILMS
  • 3.1 Introduction
  • 3.2 Theory
  • 3.3 Experiment
  • 3.4 Results and Discussion
  • 3.4a Dependence of film thickness
  • Fig.3.4.1 Plot of in σ versus 1000/T for MgPc film of thickness-5710A, 5720 A and 8550A
  • Fig.3.4.1 Plot of in σ versus 10000/T for MgPc film of thickness-5710A, 5720A.8430A and 8550A
  • Fig.3.4.2 Plot of In σ versus 1000/T for FePc film of thicknesses 1310A, 1840A. 2090A and 2290A
  • Fig.3.4.3 Plot of in σ versus 1000/T for ZnPc films of thicknesses 1350A 2680A and 3750A
  • 3.4b Dependence of substrate temperature
  • 3.4c Dependence of air annealing
  • 3.4d Dependence of vacuum annealing
  • 3.5 Conclusion
  • References
  • 4. OPTICAL STUDIES IN MAGNESIUM PHTHALOCYANINE, IRON PHTHALOCYANINE AND ZINC PHTHALOCYANINE THIN FILMS
  • 4.1 Introduction
  • 4.2 Theory
  • Fig.4.2.1 Direct transition from valence band to conduction band
  • Fig.4.2.2 Indirect transition from valence band to conduction band
  • Fig.4.2.3 Illustration of Burstein Moss shift
  • 4.3 Experiment
  • 4.4 Results and Discussion
  • Fig. 4.4.1 Absorbance versus wavelength spectrum for MgPc film of thickness 3600A
  • Fig.4.4.2 Absorbance versus wavelength spectrum for FePc film of thickness 3400A
  • Fig.4.4.3 Absorbance versus wavelength spectrum for ZnPc film of thickness 2290.A
  • Fig.4.4.4 The molecular orbitals of metal phthalocyanines based on four-orbital calculations
  • Fig.4.4.5 Plot of σ 2 versus hu for MgPc film of thickness 3600A deposited at roorn temperature
  • Fig.4.4.6 Plot of σ2 versus hu for FePc film of thickness 3400A deposited at room temperature
  • Fig.4.4.7 Plot of σ2 versus hu for ZnPc film of thickness 2290A deposited at room temperature
  • 4.5 Conclusion
  • References
  • 5. X-RAY DIFFRACTION STUDIES IN MAGNESIUM PHTHALOCYANINE, IRON PHTHALOCYANINE AND ZINC PHTHALOCYANINE THIN FILMS
  • 5.1 Introduction
  • 5.2 Theory
  • 5.3 Experiment
  • 5.4 Results and Discussion
  • Fig.5.4.1 Schematic diagrams of lattice orientations of molecular stacking of zinc phthalocyanine in σ and β forms
  • Fig.5.4.2 XRD Pattern of MgPc powder
  • Fig.5.4.3 XRD Patternof fePc powder
  • Fig.5.4.4 XRD Pattern of ZnPc Powder
  • Fig.5.4.5 XRD Pattern of ZnPc film of thivkness 5500A deposited at room temperature
  • 5.4a Effect of substrate temperature
  • 5.4b Effect of annealing in air
  • Fig.5.4.11a XRD Pattern of ZnPc film annealed in air at 3734K
  • 5.4c Effect of annealing in vacuum
  • 5.5 Conclusion
  • References
  • 6. SUMMARY AND CONCLUSION